Teradyne TUG 2014

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Sample Hot Topics

Hot Topics

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2015 Call for Papers

Hot Topics

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Submit Your Abstract


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Hot Topics

Hot topics are only suggested topics. We will accept abstracts for any topic relevant to Teradyne products and our industry. A few hot topics are listed below...for a full list, click on the link to the left.

  • Concurrent Test: Using Multiple Time Domains and Protocol Aware Engines
  • Testing High-speed Serial Interfaces
  • Concurrent Test of Multi-chip Devices
  • High-speed Memory Test Techniques
  • Windows XP to Windows 7/8 Migration
  • Testing Unique Busses Using the Bi4-Series and HSSub
  • Testing LTE Devices
  • WirelessHD (60+ GHz)
  • Test Program Meta-Language and Automatic Test Code Generation
  • Sophisticated Automation of ATE Systems
  • Parallel Test Efficiency
  • Techniques for Optimizing Test Program Throughput
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