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Sample Hot Topics
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2015 Call for Papers
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Submit Your Abstract
Hot TopicsHot topics are only suggested topics. We will accept abstracts for any topic relevant to Teradyne products and our industry. A few hot topics are listed below...for a full list, click on the link to the left.
- Concurrent Test: Using Multiple Time Domains and Protocol Aware Engines
- Testing High-speed Serial Interfaces
- Concurrent Test of Multi-chip Devices
- High-speed Memory Test Techniques
- Windows XP to Windows 7/8 Migration
- Testing Unique Busses Using the Bi4-Series and HSSub
- Testing LTE Devices
- WirelessHD (60+ GHz)
- Test Program Meta-Language and Automatic Test Code Generation
- Sophisticated Automation of ATE Systems
- Parallel Test Efficiency
- Techniques for Optimizing Test Program Throughput