Tuesday 4/29/14: Morning Sessions				(click here for Wednesday's schedule)
7:30 am	Breakfast
	TEST INFRASTRUCTURE AND PRODUCTION	MEMORY	RF WIRELESS	DIGITAL	POWER MGMT / AUTOMOTIVE	INSTRUCTOR-LED (ILO) TRAINING	VENDOR FAIR
8:30 a.m.	TUG Business Meeting
8:45 a.m.	Semiconductor Business Meeting & Engineering Update
10:00 a.m.	Break						Vendor Fair 10 a.m. - 5 p.m.
10:30 a.m.	A Study on Optimized Settling Time and Device Interface Board Application for Measuring Static Power Dissipation of the Device with Large Capacitor Applications   (80)	How to Implement the Capture Processor on the Nextest MPAC Option to Test a DAC  (23)	UltraWave24: The Future of RF Test (172)	My TF and ATPG Patterns Are Failing: Tips and Tricks to Debug Them  (26)	Terminating Toxic Test (32)	TimeLines: An IG-XL Tool for Test Time Reduction (58) This 90-minute session will be delivered in a classroom at TUG using remote offline workstations.
11:00 a.m.	Resolving Encryption Issues with Teradyne's Test Program Protection Tool  (64)	How to Use the Nextest Magnum DBM as a Digital Send Instrument (126)		Synchronization of UltraPin800 and SB6G for JTAG Test of JESD High Speed Serial I/Os (66)
11:30 a.m.	100X Faster ASCII Worksheet Import in Excel  (45)	Testing 2304 ADCs Concurrently Using The Magnum I Plus MPAC Option Board  (51)		MIPI D-PHY Loopback Relays Can Be Replaced with UltraFLEX UltraPin1600 Passive Loopback Path  (89)	Taking Full Advantage of ETS-800 APEx Architecture (60)
12:00 p.m.	Lunch
Tuesday 4/29/14: Afternoon Sessions
	TEST INFRASTRUCTURE AND PRODUCTION	MIXED SIGNAL	RF WIRELESS	DIGITAL	POWER MGMT / AUTOMOTIVE	INSTRUCTOR-LED (ILO) TRAINING
1:00 p.m.	Visual Basic Dictionaries: Solve Your Software Interfacing Problems  (124)	High-speed SerDes DAC and ADC Test Solution  (82)	Testing Wideband IQ Signals Using UltraFLEX UltraWave 12G Receivers  (44)	UltraSerial10G, Jitter and Eye Analysis Over the 10.7Gbps  (47)	Time Measurement of Real World Signals  (147)	Pin Margin Tool & IG-XL V8.20.00 (170) This 90-minute session will be delivered in a classroom at TUG using remote offline workstations.
1:30 p.m.		Mixed Signal ADC Testing with the UltraVI80 Instrument  (130)	Multisite RF Probe on the J750  (118)	Effect of Training Data Variations on the CDR Lock Time  (29)	Challenges of Mobile PMIC Device Testing on ETS-800 with Direct Probe I/F  (86)
2:00 p.m.	Modular Programming on the J750 (119)	Rotating Gravity - Frequency Domain Test for MEMS  (145)	RF Performance in Array Structures Based On Ground Placement  (121)	High Speed and Multi-Lane Testing Using XD Module  (46)	Best Practices and Test Techniques with UPU-64 on ETS-800 (146)
2:30 p.m.	Leveraging a Code Library to Speed Inter-Platform Code Application  (129)		Testing RFIC Devices Over DigRF v4  (168)
3:00 p.m.	Vendor Fair / Round Tables / Poster Sessions
	Increasing Tester Resource Utilization Efficiency for Continuity Test to Reduce Test Time and System Resources  (95)	Adaptive ETS Resources Application (106)		High Speed Digital Programming Techniques by Differential Measurement  (36)		TimeLines: An IG-XL Tool for Test Time Reduction (58) This 90-minute session will be delivered in a classroom at TUG using remote offline workstations.
	High Site Count Test Solution Using 10K Probe Tower  (13)
	PCB Integrated Solution for IC Testing  (59)
	Examining the Throughput Benefits of Distributed vs. Centralized Multicore Computing  (109)