Teradyne TUG 2013




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TERADYNE USERS GROUP

Thank you to all who made TUG 2014 a success. Over 300 attendees gathered for three days of technical knowledge sharing at the Anaheim Marriott in Anaheim, California. Copies of the technical papers and presentations are available now to conference attendees in the eKnowledge portal. All Teradyne users will have access beginning on June 1, 2014.

Congratulations to the TUG 2014 Best Paper Winners!

DIGITAL
The Benefits and Use Model for Concurrent Pattern Testing on the J750Ex-HD
Dan Murphy, Teradyne (127)

MEMORY
Controlling Voltages in a Pattern on the Nextest Magnum I
Brandon Bohlen and Patrick O'Connell, Cypress Semiconductor (152)

MIXED SIGNAL
Rotating Gravity - Frequency Domain Test for MEMS
Dan Thornton, Analog Devices (145)

POWER MANAGEMENT / AUTOMOTIVE
Terminating Toxic Test
Jack Weimer, Teradyne (32)

RF WIRELESS
UltraWave 24: Future of RF Test
Ronald Burke, Teradyne (172)

TEST INFRASTRUCTURE AND PRODUCTION
100X Faster ASCII Worksheet Import in Excel
Glenn Carson, Freescale (45)

 

SAVE THE DATE! Join us for TUG 2015 at the Loews Royal Pacific Resort in Orlando, Florida on May 4-6, 2015.

 

 

 

 

 
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